2024 Shared Facilities: Anisotropy-Driven Crystallization of Dimensionally Resolved Quasi-1D Van der Waals Nanostructures
The Anton Paar AFM is a compact system with a large sample stage that enables users to detect surface topography down to atomic steps. This AFM not only provides basic surface imaging in both contact tapping mode and contact mode but also several advanced modes such as Magnetic force microscopy (MFM), Kelvin Probe Force Microscopy (KPFM), Conductive Atomic Force Microscopy (C-AFM), Current Control Conductive Atomic Force Mode (CCC-AFM) and force-distance measurement.
- The discovery and understanding of the physical properties of emergent low-dimensional materials rely on tools that enable the facile probing of size, dimensionality, and morphologies of nanocrystals with high spatial/dimensional resolution
- Through the Anton Paar AFM, the Arguilla group was able to demonstrate for the first time the precise control of bottom-up vapor growth of a quasi-1D van der Waals crystal, Sb2S3, into well-defined and ultra-thin 1D nanowires and quasi-2D nanosheets.
- Size-dependent photoluminescence measurements aided by the Anton Paar AFM, enabled the group to show the systematic quantum confinement-induced indirect-to-direct band gap crossover based on ~450 nm- down to ~13 nm-thick nanowires
Cordova, D. L. M.; Chua, K.; Huynh, R. M.; Aoki, T.; Arguilla, M. Q.
(UC Irvine)
Cordova, D. L. M.; Chua, K.; Huynh, R. M.; Aoki, T.; Arguilla, M. Q., Anisotropy-Driven Crystallization of Dimensionally Resolved Quasi-1D Van der Waals Nanostructures. Journal of the American Chemical Society 2023, 145 (41), 22413-22424. (Featured as the front journal cover for vol. 145 issue 41)